Cracking and adhesion at small scales: atomistic and continuum studies of flaw tolerant nanostructures

Once the characteristic size of materials reaches nanoscale, the mechanical properties may change drastically and classical mechanisms of materials failure may cease to hold. In this paper, we focus on joint atomistic-continuum studies of failure and deformation of nanoscale materials. In the first part of the paper, we discuss the size dependence of brittle fracture. We illustrate that if the characteristic dimension of a material is below a critical length scale that can be on the order of several nanometres, the classical Griffith theory of fracture no longer holds. An important consequence of this finding is that materials with nano-substructures may become flaw-tolerant, as the stress concentration at crack tips disappears and failure always occurs at the theoretical strength of materials, regardless of defects. Our atomistic simulations complement recent continuum analysis (Gao et al 2003 Proc. Natl Acad. Sci. USA 100 5597–600) and reveal a smooth transition between Griffith modes of failure via crack propagation to uniform bond rupture at theoretical strength below a nanometre critical length. Our results may have consequences for understanding failure of many small-scale materials. In the second part of this paper, we focus on the size dependence of adhesion systems. We demonstrate that optimal adhesion can be achieved by either length scale reduction, or by optimization of the shape of the surface of the adhesion element. We find that whereas change in shape can lead to optimal adhesion strength, those systems are not robust against small deviations from the optimal shape. In contrast, reducing the dimensions of the adhesion system results in robust adhesion devices that fail at their theoretical strength, regardless of the presence of flaws. An important consequence of this finding is that even under the presence of surface roughness, optimal adhesion is possible provided the size of contact elements is sufficiently small. Our 4 Author to whom any correspondence should be addressed. 0965-0393/06/050799+18$30.00 © 2006 IOP Publishing Ltd Printed in the UK 799